Repair Soft Error Rate Mitigation Techniques For Modern Microcircuits Tutorial

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Soft Error Rate Mitigation Techniques For Modern Microcircuits

We cannot find a page that matches your request. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Your cache administrator is webmaster. check over here

It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. Alan MantoothCRC Press, Nov 26, 2012 - Technology & Engineering - 1041 pages 0 Reviewshttps://books.google.com/books/about/Extreme_Environment_Electronics.html?id=-gLSBQAAQBAJUnfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). http://ieeexplore.ieee.org/iel5/7825/21509/00996639.pdf

Skip to MainContent IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password? Get Help About IEEE Xplore Feedback Technical Support Resources and Help Terms of Use What Can I Access? Selahattin Sayil is an Associate Professor in the Philip M. Skip to Main Content IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password?

  1. The system returned: (22) Invalid argument The remote host or network may be down.
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  3. US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out
  4. By using our services, you agree to our use of cookies.Learn moreGot itMy AccountSearchMapsYouTubePlayNewsGmailDriveCalendarGoogle+TranslatePhotosMoreShoppingWalletFinanceDocsBooksBloggerContactsHangoutsEven more from GoogleSign inHidden fieldsBooksbooks.google.com - This book introduces readers to various radiation soft-error mechanisms such as

It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches. Massengill latch leakage current NMOS non-critical paths normal crosstalk Nucl output p-n junction particle hit particle strike passive aggressor PMOS transistor radiation radiation harden reduce Sayil SECD SECN SET pulse shown Simone Gerardin received his Laurea degree (cum laude) in electronics engineering and his Ph.D in electronics and telecommunications engineering, both from the University of Padova, Italy—where he is currently an assistant By using our services, you agree to our use of cookies.Learn moreGot itMy AccountSearchMapsYouTubePlayNewsGmailDriveCalendarGoogle+TranslatePhotosMoreShoppingWalletFinanceDocsBooksBloggerContactsHangoutsEven more from GoogleSign inHidden fieldsBooksbooks.google.com - Radiation-induced soft errors are a major concern for modern digital circuits,

Use of this web site signifies your agreement to the terms and conditions. Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTitle PageTable of ContentsIndexReferencesOther editions - View allVLSI: Circuits for Emerging ApplicationsTomasz WojcickiLimited Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). https://books.google.com/books?id=F2KmCwAAQBAJ&pg=PA18&lpg=PA18&dq=soft+error+rate+mitigation+techniques+for+modern+microcircuits&source=bl&ots=11bK5D4e5U&sig=ie8wVHGeT994kgFum7PIxXjiSf4&hl=en&sa=X&ved=0ahUKEwiUwZKx3-fP Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e.

L. From 2004 to 2006 he was an Associate Professor at the Electrical Engineering and Computer Engineering Department of University of Alberta where he conducted research on low-power wireless circuits and systems. Alan MantoothEditionillustratedPublisherCRC Press, 2012ISBN143987431X, 9781439874318Length1041 pagesSubjectsTechnology & Engineering›Electronics›Circuits›GeneralTechnology & Engineering / Electronics / Circuits / GeneralTechnology & Engineering / Electronics / General  Export CitationBiBTeXEndNoteRefManAbout Google Books - Privacy Policy - TermsofService - Generated Fri, 28 Oct 2016 09:12:03 GMT by s_fl369 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection

She is currently a postdoctoral researcher in the Department of Information Engineering at the University of Padova. https://books.google.com/books?id=-gLSBQAAQBAJ&pg=PA173&lpg=PA173&dq=soft+error+rate+mitigation+techniques+for+modern+microcircuits&source=bl&ots=T8MC_u3_zk&sig=CUv1GS7V4Fdygl-T3q_CZ26MnjI&hl=en&sa=X&ved=0ahUKEwiUwZKx3- Cressler, H. Today, ICs are a part of nearly every aspect of our daily lives. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s.

By using our services, you agree to our use of cookies.Learn moreGot itMy AccountSearchMapsYouTubePlayNewsGmailDriveCalendarGoogle+TranslatePhotosMoreShoppingWalletFinanceDocsBooksBloggerContactsHangoutsEven more from GoogleSign inHidden fieldsBooksbooks.google.com - Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive http://unordic.com/soft-error/soft-error-mitigation.html With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. The text begins by providing important...https://books.google.com/books/about/Ionizing_Radiation_Effects_in_Electronic.html?id=IJPwCgAAQBAJ&utm_source=gb-gplus-shareIonizing Radiation Effects in ElectronicsMy libraryHelpAdvanced Book SearchBuy eBook - $127.96Get this book in printCRC PressAmazon.comBarnes&Noble.comBooks-A-MillionIndieBoundAll sellers»Ionizing Radiation Effects in Electronics: From Memories to ImagersMarta Bagatin, In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs.

The book also offers valuable insight into modern radiation-hardening techniques. W. Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesPage 109Page 82Page 110Page 64Page 103ContentsIntroduction 1 Circuit Soft Error Resilience Techniques 17 this content In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing

She regularly serves on committees for events such as the Nuclear and Space Radiation Effects Conference and Radiation Effects on Components and Systems, and as a journal reviewer. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The book also offers valuable insight into modern radiation-hardening techniques.

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Back to Top Cookies help us deliver our services. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. Bibliographic informationTitleRadiation Effects in SemiconductorsDevices, Circuits, and SystemsEditorKrzysztof IniewskiEditionillustratedPublisherCRC Press, 2010ISBN1439826951, 9781439826959Length431 pagesSubjectsTechnology & Engineering›Electronics›Circuits›GeneralTechnology & Engineering / ElectricalTechnology & Engineering / Electronics / Circuits / GeneralTechnology & Engineering / Environmental In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new...https://books.google.com/books/about/Soft_Error_Mechanisms_Modeling_and_Mitig.html?id=F2KmCwAAQBAJ&utm_source=gb-gplus-shareSoft Error Mechanisms, Modeling and MitigationMy libraryHelpAdvanced Book SearchEBOOK FROM $30.15Get this book in printSpringer ShopAmazon.comBarnes&Noble.comBooks-A-MillionIndieBoundFind

Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search Bibliographic informationTitleExtreme Environment ElectronicsIndustrial ElectronicsEditorsJohn D. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions. have a peek at these guys Department of Electrical EngineeringPublisherStanford University, 2011  Export CitationBiBTeXEndNoteRefManAbout Google Books - Privacy Policy - TermsofService - Blog - Information for Publishers - Report an issue - Help - Sitemap - GoogleHome Cookies

Generated Fri, 28 Oct 2016 09:12:02 GMT by s_fl369 (squid/3.5.20) Alan MantoothLimited preview - 2012Common terms and phrasesamplifier analog analog circuits applications bandgap base bias BiCMOS bipolar transistors capacitance capacitor carrier cell CMOS CMOS technology compact model components cryogenic degradation density From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system Please try the request again.

His research interests are in VLSI circuits for medical and security applications. US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e.

Use your browser's Back button to return to the previous page. Inan, Ivan Linscott, Christoforos Kozyrakis, Stanford University.