How To Fix Soft Error Rate Estimation (Solved)

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Soft Error Rate Estimation

IEEE Des Test of Computers 30(2):77–8613.Kuo Y-H, Peng H-K, Wen C H-P (2010) Accurate Statistical Soft Error Rate (SSER) analysis using a quasi-monte carlo framework with quality cell models. Screen reader users, click here to load entire articleThis page uses JavaScript to progressively load the article content as a user scrolls. Allowing a website to create a cookie does not give that or any other site access to the rest of your computer, and only the site that created the cookie can Please try the request again. check over here

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Your cache administrator is webmaster. Tata McGraw-Hill Education23.Parameters of Low Power SoC Design (2003) [Online]. Not logged in Not affiliated 5.157.55.22 ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.6/ Connection to 0.0.0.6 failed.

or its licensors or contributors. To achieve maximum efficiency in terms of power, performance, and reliability in dynamic scaling of voltage and frequency, it is critical to have a simple and accurate reliability model which estimates Technical Report JESD892.Asadi H, Tahoori MB, Fazeli M, Miremadi SG (2012) Efficient algorithms to accurately compute derating factors of digital circuits. IEEE Trans Nucl Sci (TNS) 50(3):583–602CrossRefGoogle Scholar8.Dodd PE, Massengill LW (2003) Basic mechanisms and modeling of single-event upset in digital microelectronics.

MetraReferences1.(2001) JEDEC standard: measurements and reporting of alpha particles and terrestrial comic ray-induced soft errors in semiconductor devices. US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out Your browser does not support cookies. http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7303985 Screen reader users, click the load entire article button to bypass dynamically loaded article content.

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  • Proceedings of the International Conference Computer Aided Design (ICCAD), pp. 157–16325.Raji M, Pedram H, Ghavami B (2015) A practical metric for soft error vulnerability analysis of combinational circuits.
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  • MIT Press & McGraw-Hill, 2nd edition6.Dixit A, Wood A (2011) The impact of new technology on soft error rates.
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  • View full text Microelectronics ReliabilityVolume 51, Issue 2, February 2011, Pages 460–4672010 Reliability of Compound Semiconductors (ROCS) WorkshopEdited By Peter Ersland and Roberto MenozziPrognostics and Health ManagementEdited By Daniel

All rights reserved. try this Proceedings of the 40th IEEE Southeastern Symposium on System Theory (SSST), pp. 324–328Copyright information© Springer Science+Business Media New York 2016Authors and AffiliationsMohsen Raji1Email authorBehnam Ghavami231.School of Electrical and Computer EngineeringShiraz UniversityShirazIran2.Department of Computer EngineeringShahid Bahonar If your computer's clock shows a date before 1 Jan 1970, the browser will automatically forget the cookie. Try a different browser if you suspect this.

Microelectron Reliab 55(2):448–460CrossRefGoogle Scholar26.Raji M, Pedram H, Ghavami B (2015) Soft error rate estimation of combinational circuits based on vulnerability analysis. http://unordic.com/soft-error/soft-error-rate-dram.html Besides, power consumption and reliability significantly vary across workloads and among pieces of a single application which can be exploited to design adaptive runtime fault tolerant and low power systems. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile Your cache administrator is webmaster.

Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General JavaScript is disabled on your browser. Dependable Systems and Networks (DSN), pp. 389–39831.Wang F, Agrawal VD (2008) Soft Error Rate Determination for Nanometer CMOS VLSI Circuits. this content In general, only the information that you provide, or the choices you make while visiting a web site, can be stored in a cookie.

International reliability physics symposium (IRPS), pp. 199–20511.Hatami S, Abrishami H, Pedram M (2008) Statistical timing analysis of flip-flops considering codependent setup and hold times. For more information, visit the cookies page.Copyright © 2016 Elsevier B.V. Experimental results show that the proposed method provides considerable speedup (about 5 orders of magnitude) with less than 5 % accuracy loss when compared to Monte-Carlo SPICE simulations.

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Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General You need to reset your browser to accept cookies or to ask you if you want to accept cookies. In addition, the proposed framework, keeps its efficiency when considering a full spectrum charge collections (more than 36X speedups compared to the most recently published similar work).KeywordsSoft error rateSoft errorTransient faultsProcess Sunnyvale, CA [Online].

More information Accept Over 10 million scientific documents at your fingertips Switch Edition Academic Edition Corporate Edition Home Impressum Legal Information Contact Us © 2016 Springer International Publishing AG. IEEE Trans Very Large Scale Integr (VLSI) Syst 17(8):1161–116629.Shazli SZ, Abdul-Aziz M, Tahoori MB, Kaeli DR (2008) A field analysis of system-level effects of soft errors occurring in microprocessors used in The date on your computer is in the past. have a peek at these guys Related book content No articles found.

However, those attempts are driven by complicated simulations and hardly deliver a sense of direction to the designers. Proceedings of the International Symposium Quality Electron. To accept cookies from this site, use the Back button and accept the cookie. Your cache administrator is webmaster.

You have installed an application that monitors or blocks cookies from being set. Microelectron Reliab 52:1215–1226CrossRefGoogle Scholar3.Blaauw D, Chopra K, Srivastava A, Scheffer L (2008) Statistical timing analysis: from basic principles to state of the art. Proceedings of ACM Great Lakes symposium on VLSI (GLSVLSI), pp. 101–10612.Huang H-M, Wen CH-P (2013) Fast-yet-accurate statistical soft error rate analysis considering full-spectrum charge collection. Below are the most common reasons: You have cookies disabled in your browser.

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The system returned: (22) Invalid argument The remote host or network may be down. Click the View full text link to bypass dynamically loaded article content. The experimental results of this paper prove that our proposed model offers precise estimates of reliability in accordance with the results of accurate soft error rate (SER) estimation algorithm for ISCAS85’s Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search

The vulnerability of the circuits to soft errors is analyzed using a newly defined concept called Statistical Vulnerability Window (SVW). J Electron Test (2016) 32: 291. ScienceDirect ® is a registered trademark of Elsevier B.V.RELX Group Recommended articles No articles found. This site uses cookies to improve performance by remembering that you are logged in when you go from page to page.

Why Does this Site Require Cookies? International Reliability Physics Symposium (IRPS), pp. 5B.4.1–5B.4.77.Dodd PE, Massengill LW (2003) Basic mechanisms and modeling of single-event upset in digital microelectronics. Please enable JavaScript to use all the features on this page. IET Comput Digit Tech 9(6):311–320CrossRefGoogle Scholar27.Ramakrishnan K, Rajaraman R, Suresh S, Nijaykrishnan N, Xie Y, Irwin MJ (2006) Variation Impacts on SER of Combinational Circuits.