How To Repair Soft Error Rate Estimation And Mitigation For Sram Based Fpgas (Solved)

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Soft Error Rate Estimation And Mitigation For Sram Based Fpgas

SEUs can occur when a charged particle impacts the silicon substrate with enough energy to incur either a transient pulse in a combinational logic component or a state flip in a Please try the request again. The proposed approach does not require physical implementation. SIGN IN SIGN UP Soft error rate estimation and mitigation for SRAM-based FPGAs Full Text: PDF Get this Article Authors: Ghazanfar Asadi Northeastern University, Boston, MA Mehdi B. check over here

Bibliographic informationTitleReconfigurable Computing: Architectures, Tools and Applications: 5th International Workshop, ARC 2009, Karlsruhe, Germany, March 16-18, 2009, ProceedingsLNCS sublibrary. DeMaraRead full-textShow moreRecommended publicationsConference PaperFault injection into SRAM-based FPGAs for the analysis of SEU effectsOctober 2016G. Your cache administrator is webmaster. Contemporary con?gurable architectures allow... Computing: Architectures, Tools and ApplicationsMy libraryHelpAdvanced Book SearchView eBookGet this book in printSpringer ShopAmazon.comBarnes& - $84.45 and upBooks-A-MillionIndieBoundFind in a libraryAll sellers»Reconfigurable Computing: Architectures, Tools and Applications:

The system returned: (22) Invalid argument The remote host or network may be down. We also present a high-reliable low-cost mitigation technique which can significantly improve the availability of FPGA-based designs. Moreover, PR is employed to keep the system on line while under repair and also to reduce repair time. Moreover, the ?exibility enabled by recon?guration is also seen as a basic technique for overcoming transient failures in emerging device structures.

  1. Your cache administrator is webmaster.
  2. ZarandiAlireza EjlaliRead moreConference PaperSoft error mitigation for SRAM-based FPGAsOctober 2016Hossein AsadiM.B.
  3. Keyphrases analytical approach soft error rate estimation sram-based fpgas failure rate asic design fpga ser estimation soft error rate single-event upset mean time time-consuming fault injection previous technique soft error tolerant
  4. Generated Fri, 28 Oct 2016 01:18:07 GMT by s_mf18 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: Connection

Compared to standard microprocessor architectures, advantages are possible in terms of power consumption on a broad range of di?erent application ?elds. morefromWikipedia Application-specific integrated circuit An application-specific integrated circuit, or ASIC /¿e¿s¿k/, is an integrated circuit (IC) customized for a particular use, rather than intended for general-purpose use. Full-text · Article · Sep 2014 Fatima Zahra TaziClaude ThibeaultYvon Savaria+1 more author ...Yves AudetRead full-textExploiting free LUT entries to mitigate soft errors in SRAM-based FPGAs"The first step of performing soft The ACM Guide to Computing Literature All Tags Export Formats Save to Binder For full functionality of ResearchGate it is necessary to enable JavaScript.

The proposed technique replaces not fully-occupied LUTs with corresponding functional equivalent classes, which can improve the reliability while preserve the functionality of the design. Publisher conditions are provided by RoMEO. Organic computing paradigms have been proposed for fault-tolerant systems because they promote behaviors that allow complex digital systems to adapt and survive in demanding environments. Contemporary con?gurable architectures allow for the de?nition of architectures with functional and storage units that match the s- ci?c needs of a given computation, in terms of function, bit-width and control

The fault injection experiments allow a better understanding of the behaviour of IOBs affected by additional delays due to configuration bit flips, which in many cases is similar to what can Corchado, Ajith Abraham, Shyue-Liang WangSpringer, Jun 5, 2014 - Computers - 603 pages 1 Review volume presents the proceedings of the First Euro-China Conference on Intelligent Data Analysis and Applications (ECC Did you know your Organization can subscribe to the ACM Digital Library? Soft error rate (SER) estimation is a crucial step in design of soft error tolerant schemes to balance reliability, performance, and cost of the system.

This mitigates possible speed and density disadvantages that conventional FPGAs could have over ASICs and it translates into higher capability and speeds when compared to rad-hard FPGAs. "[Show abstract] [Hide abstract] Results from these irradiation experiments show that RO period variations, up to 6.2 ns for Virtex-5 and 3.8 ns for Artix-7, could be induced. Techniques for achieving recon?gurable systems are numerous and require the joint development of recon?gurable hardware systems to support the dynamic behavior, e.g., suitable programming models, tools and languages, to support the Reliability Engineering is a sub-discipline within Systems Engineering.

This includes veri?cation techniques that can demonstrate formally correct recon?- ration sequences at each stage. check my blog Full-text · Article · Jun 2011 Rawad Al-HaddadRashad OreifejRizwan AshrafRonald F. morefromWikipedia Tools and Resources Buy this Article Recommend the ACM DLto your organization Request Permissions TOC Service: Email RSS Save to Binder Export Formats: BibTeX EndNote ACMRef Upcoming Conference: FPGA '17 In this work, we observe that there are a lot of not-fully occupied look-up tables (LUTs) after logic synthesis.

Differing provisions from the publisher's actual policy or licence agreement may be applicable.This publication is from a journal that may support self archiving.Learn moreLast Updated: 29 Aug 16 © 2008-2016 For example, a chip designed to run in a digital voice recorder is an ASIC. The system returned: (22) Invalid argument The remote host or network may be down. Your cache administrator is webmaster.

Corchado,Ajith Abraham,Shyue-Liang WangNo preview available - 2014View all »Common terms and phrasesaccuracy Advances in Intelligent annotation Applications calculate chaotic classifier cluster coded aperture color compression Computing 298 database decryption denotes depth The FPGA configuration is generally specified using a hardware description language (HDL), similar to that used for an application-specific integrated circuit (ASIC) (circuit diagrams were previously used to specify the configuration, Your cache administrator is webmaster.

The hardware layer is implemented on a Xilinx Virtex-4 Field Programmable Gate Array (FPGA) to provide self-repair using a novel approach called reconfigurable adaptive redundancy system (RARS).

morefromWikipedia Field-programmable gate array A field-programmable gate array (FPGA) is an integrated circuit designed to be configured by the customer or designer after manufacturing¿hence "field-programmable". Generated Fri, 28 Oct 2016 01:18:07 GMT by s_mf18 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: Connection The software layer supervises the organic activities on the FPGA and extends the self-healing capabilities through application-independent, intrinsic, and evolutionary repair techniques that leverage the benefits of dynamic partial reconfiguration (PR). All rights reserved.About us · Contact us · Careers · Developers · News · Help Center · Privacy · Terms · Copyright | Advertising · Recruiting orDiscover by subject areaRecruit researchersJoin for freeLog in EmailPasswordForgot password?Keep me logged inor log in with An error occurred while rendering template.

morefromWikipedia Fault injection In software testing, fault injection is a technique for improving the coverage of a test by introducing faults to test code paths, in particular error handling code paths, While there are many problems, the existence and development of technologies such as recent multi- and many-core processor arc- tectures, dynamically recon?gurable and multi-grain computing architectures, as well as application-speci?c processors SL 1 - Theoretical computer science and general issuesVolume 5453 of Lecture Notes in Computer ScienceLecture notes in computer science: Lecture notes in artificial intelligenceTheoretical Computer Science and General IssuesAuthorsJürgen Becker, have a peek at these guys For example, an automobile's failure rate in its fifth year of service may be many times greater than its failure rate during its first year of service.

Please try the request again. AsadiSeyed Ghassem MiremadiHamid R. In this paper, we present an analytical approach to estimate the failure rate of designs mapped into FPGAs. ZarandiAlireza EjlaliRead moreArticleAn analytical approach for soft error rate estimation of SRAM-based FPGAsOctober 2016Ghazanfar AsadiMehdi B TahooriRead moreConference PaperEvaluation of Fault-Tolerant Designs Implemented on SRAM-Based FPGAs.October 2016Ghazanfar AsadiSeyed Ghassem MiremadiHamid R.

Previous techniques on FPGA SER estimation are based on time-consuming fault injection and simulation methods.In this paper, we present an analytical approach to estimate the failure rate of designs mapped into Errors may be caused by a defect, usually understood either to be a mistake in design or construction, or a broken component. Copyright © 2016 ACM, Inc. On the other hand, error propagation probability of the fault at element í µí±— (í µí°¸í µí±ƒ í µí±ƒ í µí±— ) describes the criticality of the element, which is characterized

The system returned: (22) Invalid argument The remote host or network may be down. It is often denoted by the Greek letter ¿ (lambda) and is important in reliability engineering. Please try the request again. Preview this book » What people are saying-Write a reviewUser Review - Flag as inappropriateIntelligent Data analysis and its Applications, Volume II: Proceeding of the ...Selected pagesTitle PageTable of ContentsIndexContentsPart II

Please try the request again. morefromWikipedia Failure rate Failure rate is the frequency with which an engineered system or component fails, expressed for example in failures per hour. Reliability is often measured as probability of failure, frequency of failures, or in terms of availability, a probability derived from reliability and maintainability. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g.

It is often used with stress testing and is widely considered to be an important part of developing robust software. The failure rate of a system usually depends on time, with the rate varying over the life cycle of the system.