How To Fix Soft Error Mitigation For Sram Based Fpgas Tutorial

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Soft Error Mitigation For Sram Based Fpgas

This mitigates possible speed and density disadvantages that conventional FPGAs could have over ASICs and it translates into higher capability and speeds when compared to rad-hard FPGAs. "[Show abstract] [Hide abstract] On the other hand, error propagation probability of the fault at element í µí±— (í µí°¸í µí±ƒ í µí±ƒ í µí±— ) describes the criticality of the element, which is characterized Subscribe Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History View Purchased Documents Profile Information Communications Preferences Profession and Education Technical Interests Need morefromWikipedia Reliability engineering Reliability engineering is an engineering field that deals with the study, evaluation, and life-cycle management of reliability: the ability of a system or component to perform its required check over here

The results show that the area, power, and delay overheads are respectively 179%, 94%, and 60% in comparison with the simple architecture.Corresponding author.Copyright © 2010 Elsevier Ltd. The system returned: (22) Invalid argument The remote host or network may be down. Tahoori Northeastern University, Boston, MA Published in: ·Proceeding FPGA '05 Proceedings of the 2005 ACM/SIGDA 13th international symposium on Field-programmable gate arrays Pages 149-160 ACM New York, NY, USA ©2005 SEUs can occur when a charged particle impacts the silicon substrate with enough energy to incur either a transient pulse in a combinational logic component or a state flip in a see it here

Please try the request again. We also present a high-reliable low-cost mitigation technique which can significantly improve the availability of FPGA-based designs. Terms of Usage Privacy Policy Code of Ethics Contact Us Useful downloads: Adobe Reader QuickTime Windows Media Player Real Player Did you know the ACM DL App is Moreover, PR is employed to keep the system on line while under repair and also to reduce repair time.

  • The hardware layer is implemented on a Xilinx Virtex-4 Field Programmable Gate Array (FPGA) to provide self-repair using a novel approach called reconfigurable adaptive redundancy system (RARS).
  • The error in device output or operation caused as a result of the strike is called an SEU or a soft error.
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  • The system returned: (22) Invalid argument The remote host or network may be down.
  • Although carefully collected, accuracy cannot be guaranteed.

FanucciRead full-textFront-end ASICs for high-energy astrophysics in space Full-text · Conference Paper · Jul 2016 · Microprocessors and MicrosystemsO. Here are the instructions how to enable JavaScript in your web browser. Organic computing paradigms have been proposed for fault-tolerant systems because they promote behaviors that allow complex digital systems to adapt and survive in demanding environments. In this paper, we develop a sustainable modular adaptive redundancy technique (SMART) composed of a two-layered organic system.

Your cache administrator is webmaster. Publisher conditions are provided by RoMEO. DeMaraRead full-textShow morePeople who read this publication also readApplication Specific Instruction Set Processor for Sensor Conditioning in Automotive Applications Full-text · Article · Oct 2016 A. find this Please try the request again.

Please try the request again. All rights reserved.About us · Contact us · Careers · Developers · News · Help Center · Privacy · Terms · Copyright | Advertising · Recruiting We use cookies to give you the best possible experience on ResearchGate. Use of this web site signifies your agreement to the terms and conditions. morefromWikipedia Field-programmable gate array A field-programmable gate array (FPGA) is an integrated circuit designed to be configured by the customer or designer after manufacturing¿hence "field-programmable".

The software layer supervises the organic activities on the FPGA and extends the self-healing capabilities through application-independent, intrinsic, and evolutionary repair techniques that leverage the benefits of dynamic partial reconfiguration (PR). Generated Fri, 28 Oct 2016 01:09:36 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.9/ Connection These results also reveal that the occurrence rate of events (namely delays and breaks) affecting ROs implemented in IOBs is approaching the rate observed when ROs are implemented in the FPGA The system returned: (22) Invalid argument The remote host or network may be down.

morefromWikipedia Tools and Resources Buy this Article Recommend the ACM DLto your organization Request Permissions TOC Service: Email RSS Save to Binder Export Formats: BibTeX EndNote ACMRef Upcoming Conference: FPGA '17 check my blog The failure rate of a system usually depends on time, with the rate varying over the life cycle of the system. morefromWikipedia Single event upset A single event upset (SEU) is a change of state caused by ions or electro-magnetic radiation striking a sensitive node in a micro-electronic device, such as in morefromWikipedia Application-specific integrated circuit An application-specific integrated circuit, or ASIC /¿e¿s¿k/, is an integrated circuit (IC) customized for a particular use, rather than intended for general-purpose use.

The system returned: (22) Invalid argument The remote host or network may be down. Read our cookies policy to learn more.OkorDiscover by subject areaRecruit researchersJoin for freeLog in EmailPasswordForgot password?Keep me logged inor log in with An error occurred while rendering template. Close ScienceDirectJournalsBooksRegisterSign inSign in using your ScienceDirect credentialsUsernamePasswordRemember meForgotten username or password?Sign in via your institutionOpenAthens loginOther institution loginHelpJournalsBooksRegisterSign inHelpcloseSign in using your ScienceDirect credentialsUsernamePasswordRemember meForgotten username or password?Sign in via http://unordic.com/soft-error/soft-error-rate-sram.html The logic resources utilize a new function generator that can tolerate 100% of single faults in its configuration memory while it can generate all the k-input Boolean functions.

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SteinPhilip PåhlssonDirk Meier+12 more authors ...Gunnar MaehlumRead full-textData provided are for informational purposes only.

Your cache administrator is webmaster. The interest for state-of-the-art FPGAs also stems from the fact that they are usually fabricated with a technology a few nodes ahead [6] when compared to ASICs and to rad-hard FPGAs. Screen reader users, click the load entire article button to bypass dynamically loaded article content. LimousinA.

or its licensors or contributors. Hence, we propose a functional equivalent class based soft error mitigation scheme to exploit free LUT entries in the circuit. The evaluation criterion of a design against soft errors is SER [14], which is computed as the probability of a fault occurs at it. http://unordic.com/soft-error/soft-error-mitigation.html For full functionality of ResearchGate it is necessary to enable JavaScript.

memory "bit"). The ACM Guide to Computing Literature All Tags Export Formats Save to Binder Skip to Main Content IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites Cart(0) Create Experiments have shown a 27.48% decrease in repair time when PR is employed compared to the full bitstream configuration case. US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out

Application-specific standard products (ASSPs) are intermediate between ASICs and industry standard integrated circuits like the 7400 or the 4000 series. It is often denoted by the Greek letter ¿ (lambda) and is important in reliability engineering. The architecture employs two different methods in both logic and interconnection resources. Emulation experiments also reveal that many of the events modifying IOB behaviour are found to require multiple bit fault injection.

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