How To Fix Soft Error Mitigation Controller (Solved)

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Soft Error Mitigation Controller


In one embodiment, each elementary gate in the synthesized netlist is assigned a criticality class. Numbers correspond to the affiliation list which can be exposed by using the show more link. The specified correction circuit 348 performs the mitigative technique that is associated with the selected criticality class. A soft error will not damage a system's hardware; the only damage is to the data that is being processed.

When specified check circuit 344 detects a soft error, specified classification circuit 346 can determine the appropriate criticality class for the current operating state of the code block affected by the Adell and G. In one embodiment, a table is stored that is indexed by an address of the storage bits, and the table includes the criticality class of each storage bit at the address In the pictured embodiment, a BRAM tile has the same height as five CLBs, but other numbers (e.g., four) can also be used.

Sem Ip Core

Your cache administrator is webmaster. Retrieved 2015-03-10. ^ Reinhardt, Steven K.; Mukherjee, Shubhendu S. (2000). "Transient fault detection via simultaneous multithreading". Please enable JavaScript to use all the features on this page.

In certain embodiments, criticality classes designated at block 102 are modified at block 106. While many electronic systems have an MTBF that exceeds the expected lifetime of the circuit, the SER may still be unacceptable to the manufacturer or customer. A system utilising modular redundancy is then implemented and tested under the new method. Sem Xilinx Typically, the number of interconnect elements included in a tile depends on the height of the tile.

McWilliam, Opens overlay Alan Purvis ⁎, [email protected] School of Engineering and Computing Sciences, University of Durham, Received 19 June 2015, Revised 13 August 2015, Accepted 13 August 2015, Available online 27 Xapp864 Dell (1997). "A White Paper on the Benefits of Chipkill-Correct ECC for PC Server Main Memory" (PDF). A mitigative technique is associated with each criticality class. ACM SIGARCH Computer Architecture News. 30 (2): 87.

or its licensors or contributors. Xilinx Seu Fit Rate Calculator ElsevierAbout ScienceDirectRemote accessShopping cartContact and supportTerms and conditionsPrivacy policyCookies are used by this site. OpenAthens login Login via your institution Other institution login Other users also viewed these articles Do not show again Soft error From Wikipedia, the free encyclopedia Jump to: navigation, search Not For some integrated circuits, soft errors produce an amount of system reset time that exceeds the permitted down time.

  1. In practice, however, few designers can afford the greater than 200% circuit area and power overhead required, so it is usually only selectively applied.
  2. This is, of course, as good a way of describing a logic upset as any I've heard ...
  3. Modern DRAMs have much smaller feature sizes, so the deposition of a similar amount of charge could easily cause many more bits to flip.
  4. Typically, a semiconductor memory design might use forward error correction, incorporating redundant data into each word to create an error correcting code.
  5. This configuration data includes an expected value of cyclic redundancy check over the configuration memory frames 332 through 334, or enables continuous checking of the configuration memory frames 332 through 334
  6. For some circuits the capture of a thermal neutron by the nucleus of the 10B isotope of boron is particularly important.


In a logic circuit, Qcrit is defined as the minimum amount of induced charge required at a circuit node to cause a voltage pulse to propagate from that node to the Configuration data 304 is also generated from the synthesized specification, and this includes merging the generated criticality classes into the map table 350. Sem Ip Core Note that FIG. 2 is intended to illustrate only an exemplary FPGA architecture. Soft Error Mitigation Xilinx Soft errors in combinational logic[edit] The three natural masking effects in combinational logic that determine whether a single event upset (SEU) will propagate to become a soft error are electrical masking,

The core utilizes device primitives such as Virtex™-7 ICAP and ECC blocks to clock and observe the readback CRC circuit as part of the SEU detection function. check my blog Associated with code blocks 340 through 342 are designated criticality classes. The soft-error manager 338 specified in configuration data 304 includes configuration data for a check circuit 344, a classification circuit 346, and a correction circuit 348 in one embodiment. Ziegler led a program of work at IBM which culminated in the publication of a number of papers (Ziegler and Lanford, 1979) demonstrating that cosmic rays also could cause soft errors. Xilinx Seu

In one embodiment, a mitigative technique is to send a notification of the soft error or to log information specifying the soft error. Several research efforts addressed soft errors by proposing error detection and recovery via hardware-based redundant multi-threading.[13][14][15] These approaches used special hardware to replicate an application execution to identify errors in the Kastensmidt, R. this content Hard figures for DRAM susceptibility are hard to come by, and vary considerably across designs, fabrication processes, and manufacturers. 1980s technology 256 kilobit DRAMS could have clusters of five or six

V. For example, FIG. 2 illustrates an FPGA architecture (200) that includes a large number of different programmable tiles including multi-gigabit transceivers (MGTs 201), configurable logic blocks (CLBs 202), random access memory In yet another embodiment for a user design implemented in a programmable integrated circuit, a graphical layout represents the user design implemented in the programmable logic and interconnect resources of the

The embodiments may be implemented as one or more processors configured to execute software, as an application specific integrated circuit (ASIC), or as a logic on a programmable logic device.

The configuration data 304 includes configuration data for implementing a soft-error manager 338 and code blocks 340 though 342 of the user design. In this example, the pragmas specify a code block at the granularity of a single statement in the design description. Neutrons are uncharged and cannot disturb a circuit on their own, but undergo neutron capture by the nucleus of an atom in a chip. See also[edit] Electronics portal Single event upset Radiation hardening References[edit] ^ Artem Dinaburg (July 2011). "Bitsquatting - DNS Hijacking without Exploitation" (PDF). ^ Gold (1995): "This letter is to inform you

Kastil, Z. ReleaseID=759113. [2] EETimes, “With over 1 billion fpgas sold, lattice introduces machxo3 family,” id=1319597. [3] M. Description FIELD OF THE INVENTION One or more embodiments generally relate to soft errors in integrated circuits, and more particularly to mitigating soft errors in storage of integrated circuits. have a peek at these guys In another embodiment, the specification additionally specifies a placement of the elementary gates in the integrated circuit and a routing of interconnections between the elementary gates.

Inc., LogiCORE(TM) IP Soft Error Mitigation Controller v1.1 User Guide, UG764 (v1.1), Sep. 21, 2010, pp. 1-90, Xilinx, Inc., San Jose, CA USA.18Xilinx. After detecting a soft error, the integrated circuit can be reset or reconfigured to isolate and correct the soft error. In another example, the pragmas specify the criticality classes of the blocks in the hierarchy, such that all the instances of a block have the same criticality class. doi:10.1145/342001.339652.

The classification circuit determines the criticality class is severe, for example, when the current state of status register 360 indicates the corrupted storage bit configures programmable resources that are currently operating A triply-redundant soft error manager 338 includes a voting circuit and three copies or instances of each logic circuit, such as the circuits 344, 346, and 348 specified in configuration data By using this site, you agree to the Terms of Use and Privacy Policy. S.

At block 116, the mitigative technique is performed that is associated with the criticality class specified for the corrupted storage bit in the stored map. Morgan, D. The term 'multi-cell' is used for upsets affecting multiple cells of a memory, whatever correction words those cells happen to fall in. 'Multi-bit' is used when multiple bits in a single T.

The classification circuit determines the criticality class specified in the map table 350 or 352 for the combination of the corrupted storage bit and the current state of a status register External links[edit] Soft Errors in Electronic Memory - A White Paper - A good summary paper with many references - Tezzaron Jan 2004.